Taiwan Semiconductor Manufacturing Company, Ltd. has become the first foundry not only to achieve 28 nm functional 64 Mb SRAM yield, but also to achieve it across all three 28 nm nodes.

"Achieving 64 Mb SRAM yield across all three 28 nm process nodes is striking. It is particularly noteworthy because this achievement demonstrates the manufacturing benefits of the gate-last approach that we developed for the two TSMC 28 nm high-k metal gate processes," explained Dr. Jack Sun, vice president, Research and Development at TSMC.

"This accomplishment underscores TSMC's process technology capability and value in 28 nm. It shows TSMC is not only able to extend conventional SiON technology to 28 nm, but is also able to deliver the right 28 nm HKMG technology at the same time," explained Dr. Mark Liu, senior vice president, Advanced Technology Business at TSMC.

Taiwan Semiconductor Manufacturing Company today announced it has developed the first 32-nanometer (nm) technology that supports both analog and digital functionality. The company made its announcement through a paper presented at today's IEEE International Electron Devices Meeting in Washington, DC. The paper also revealed that the company had proven the full functionality of the 2Mb SRAM test chip with the smallest bit-cell at the 32nm node.

NEC Corporation today announced that it has succeeded in developing a new SRAM (Static Random Access Memory) - compatible MRAM that can operate at 250MHz, the world's fastest MRAM (Magnetoresistive Random Access Memory) operation speed. MRAM is expected to be the dominant next-generation memory technology as it realizes ultra fast operation speeds, nonvolatility - ability to retain data with the power off, and unlimited write endurance. Verification at the SRAM speed level proves that the newly-developed MRAM could be embedded in system LSIs as SRAM substitutes in the future.