That does not happen. Every time a higher bit per cell of flash is used in SSDs the endurance ratings are always lower than the previous. When MLC drives came out, their endurance ratings were significantly lower than SLC drives. As MLC matured the endurance ratings increased, but they never got to SLC levels. When TLC came out, the endurance ratings were significantly lower than MLC. As TLC matured the endurance ratings went up, but never matched MLC. Now the same is happening with QLC.
I was talking of the endurance ratings of the products, not the cells, being inflated. With TLC and QLC SSDs using multiple qualities of flash, it matters a lot how they estimate the usage patterns, as the QLC has somewhere of 1/100th - 1/1000th of the endurance of SLC, if we're optimistic.
Look at this 670p QLC device offering an impressive 370 TBW for 1 TB variant(this is close to TLC numbers), compared to the 660p at 200 TBW, both with a 140 GB SLC cache. So they mostly achieved this "improvement" in tuning how the SLC caching works, because the QLC flash itself contributes very little to this endurance number. Post
#54 from
TheLostSwede really shows in their marketing materials, they clearly have assumptions of how to use the SSD
right, assume how much will be in the SLC on average, and uses this to inflate the endurance ratings. If your usage pattern deviates from this model just a tiny bit, your endurance will be less than half, and if it deviates a lot you probably get more than one order of magnitude less.
This is in stark contrast with good MLC SSDs like Samsung 960 Pro 1TB (800 TBW) and 970 Pro 1 TB (1200 TBW), which probably have optimistic endurance ratings too, but at least they were much less sensitive to the user
using it the right way.
If intel thinks their buyers should stay <25% usage of their SSDs for them to have a
decent lifetime, then what good are these capacity gains from QLC over TLC and MLC?
And my experience contradicts yours. Of the hundreds of QLC drives I've sold through my shop at this point, not one has come back with a NAND failure(I have had a few come back due to controller failures).
Since you haven't observed the same cases, I don't think you can say it contradicts his experience, unless you somehow can discredit his observations. Proving a negative is hard; you need a significant statistical basis to claim there isn't a problem, while only needing a comparatively few samples to prove a problem exists.