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Teledyne LeCroy Launches OakGate R350-G5-PowerPlus SSD Validation Solution

Teledyne LeCroy, the worldwide leader in protocol test and measurement solutions, is pleased to announce availability of the OakGate R350-G5-PowerPlus 3U Rackmount Appliance for PCI Express 5.0, with solid state drive (SSD) power and sideband test capabilities.

Data centers and Hyperscalers are measured on their power sustainability and power usage goals and require SSD vendors to test SSD performance during normal system shutdown, abnormal system shutdown, power surges, low and/or idle power states, and voltage fluctuations. SSD vendors would ideally like these test results to highlight competitive product differentiators, often citing lower active power consumption, better power efficiencies and/or reduced cooling efficiencies. SSD design and validation test engineers can now use the OakGate R350-G5-PowerPlus Rackmount Appliance to analyze voltage and current over time and under stress to determine SSD power utilization, efficiency, and consumption, and possibly find opportunities to improve SSD power consumption. Moreover, the R350-G5-PowerPlus operates without the use of 3rd-party power interposers, reducing cost and simplifying test setup.

VESA Approves the use of New DisplayPort 2.1 Compliance Tests

Teledyne LeCroy, the worldwide leader in protocol test solutions, announced that it has received Video Electronics Standards Association (VESA) approval for testing DisplayPort 2.1 Link Training Tunable PHY Repeater (LTTPR) and Display Stream Compression (DSC) compliance with the quantumdata M42de Video Analyzer and Generator. These tests underwent extensive testing during industry workshops to ensure their accuracy and reliability and are now considered mandatory for compliance certification of DisplayPort 2.1 Ultra High Bit Rate (UHBR) capable devices.

The DisplayPort specification was updated to version 2.1 in October of 2022 and brought significant changes to link training and LTTPR operation. Design and test engineers are faced with incrementally more testing as DisplayPort chipsets add support for the new link training and other advanced features. "The need to drive higher video resolutions and frame rates raises the bar for vendors seeking VESA logo approval. Compliance testing is a key factor in delivering a robust DisplayPort technology ecosystem and outstanding customer experiences," said Bill Lempesis, executive director of VESA, which develops and administers the DisplayPort standard and compliance logo program. "Reaching this level of comprehensive test coverage so quickly after the DisplayPort 2.1 specification was released is only possible due to the close collaboration between test vendors like Teledyne LeCroy and our VESA member companies."

PCI-SIG Approves Teledyne LeCroy PCI Express 5.0 Compliance Solution

Teledyne LeCroy, the worldwide leader in serial data test solutions is pleased to announce that the Peripheral Component Interconnect Special Interest Group (PCI-SIG), responsible for the definition of serial expansion buses and related components required to drive fast, efficient transfers between processors and peripheral devices, has approved Teledyne LeCroy as a solution vendor for official PCI Express (PCIe ) 5.0 link and transaction layer compliance testing at the PCI-SIG compliance workshops.

Compliance testing allows design and test engineers to ensure product interoperability as well as adherence to the PCIe standard, enabling technology adoption among integrators. The Summit Z58 Protocol Exerciser/Analyzer which was previously approved for PCIe 3.0 and 4.0 compliance testing has now also been approved for official PCIe 5.0 compliance and certification testing, making it the only piece of test equipment currently certified for link and transaction layer testing of all three PCIe generations. Passing the PCI-SIG's compliance tests are also a necessary step for equipment to be included in the PCI-SIG's Integrators List.

Teledyne LeCroy Voyager M4x Supports USB4 Compliance Testing Program

Teledyne LeCroy, the worldwide leader in USB protocol test solutions has announced availability of their USB4 compliance test option for the Voyager M4x analyzer and exerciser system. This software option can be used in conjunction with the USB Implementers Forum's (USB-IF's) USB4 Command Verifier (USB4-CV) software to generate traffic conditions and verify responses for the official USB4 logical, protocol, and tunneling layer compliance test specifications.

USB4 combines the simplicity of the USB Type-C connector with scalable performance capable of delivering data, video, and power across a range of platforms. Design and test engineers that embed this technology into their products need robust compliance test tools to help ensure interoperability and reduce time to market. Introduced in 2019, the Voyager M4x test platform has filled a critical role for early developers performing testing, debug, and analysis of USB4 protocol layer behaviors, and the built-in USB4 exerciser option can emulate custom traffic conditions to ensure devices offer robust operation. Now, the USB4 compliance option enables the Voyager M4x exerciser to support the USB-IF's USB4-CV software for executing approved compliance tests while determining pass/fail results from traces captured by the analyzer.

Teledyne e2v Introduces First Radiation-Tolerant DDR4 Memory for Space Applications

Teledyne e2v has announced the DDR4T04G72M - the first radiation-tolerant DDR4 memory chip, featuring a total 4 GB capacity. Currently validated at 2133 MT/s, and targeting to offer 2400MT/s in the near future, this next-generation solution offers ultra-responsive low latency operation, while fitting into a highly compact form factor. Furthermore, high-reliability manufacturing and radiation-tolerant robustness makes it highly suitable for dealing with the rigors of space environments.

With 15 mm x 20 mm x 1.92 mm dimensions, this new space-grade device comprises an array of Micron based memory chips, integrated in a single package. It features a 72-bit bus, where 64 bits are dedicated to data and 8 bits to error correction code (ECC). Radiation tests have been performed on these memory chips and a single event effects (SEE) report is available from Teledyne e2v. In particular, the memory has been demonstrated to be single event latch-up (SEL) free up to 60+ MeV.cm²/mg.
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